Time-domain study on reproducibility of laser-based soft-error simulation
Studied is the soft error issue, which is a circuit malfunction caused by ion-radiation-induced noise currents. We have developed a laser-based soft-error simulation system to emulate the noise and evaluate its reproducibility in the time domain. It is found that this system, which utilizes a two-ph...
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| Veröffentlicht in: | Japanese Journal of Applied Physics 2017-04, Vol.56 (4S), p.4-04CD16 |
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| container_end_page | 04CD16 |
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| container_issue | 4S |
| container_start_page | 4 |
| container_title | Japanese Journal of Applied Physics |
| container_volume | 56 |
| creator | Itsuji, Hiroaki Kobayashi, Daisuke Lourenco, Nelson E. Hirose, Kazuyuki |
| description | Studied is the soft error issue, which is a circuit malfunction caused by ion-radiation-induced noise currents. We have developed a laser-based soft-error simulation system to emulate the noise and evaluate its reproducibility in the time domain. It is found that this system, which utilizes a two-photon absorption process, can reproduce the shape of ion-induced transient currents, which are assumed to be induced from neutrons at the ground level. A technique used to extract the initial carrier structure inside the device is also presented. |
| doi_str_mv | 10.7567/JJAP.56.04CD16 |
| format | Article |
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We have developed a laser-based soft-error simulation system to emulate the noise and evaluate its reproducibility in the time domain. It is found that this system, which utilizes a two-photon absorption process, can reproduce the shape of ion-induced transient currents, which are assumed to be induced from neutrons at the ground level. A technique used to extract the initial carrier structure inside the device is also presented.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.7567/JJAP.56.04CD16</identifier><identifier>CODEN: JJAPB6</identifier><language>eng</language><publisher>The Japan Society of Applied Physics</publisher><subject>Absorption ; Lasers ; Noise ; Reproducibility ; Simulation ; Soft errors ; Time domain ; Transient current</subject><ispartof>Japanese Journal of Applied Physics, 2017-04, Vol.56 (4S), p.4-04CD16</ispartof><rights>2017 The Japan Society of Applied Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c451t-a6394e9aecbaf861bbfe8988e67f58aca05a8d1984402c5ad1c0468c7d817b3</citedby><cites>FETCH-LOGICAL-c451t-a6394e9aecbaf861bbfe8988e67f58aca05a8d1984402c5ad1c0468c7d817b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.7567/JJAP.56.04CD16/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,776,780,27901,27902,53821,53868</link.rule.ids></links><search><creatorcontrib>Itsuji, Hiroaki</creatorcontrib><creatorcontrib>Kobayashi, Daisuke</creatorcontrib><creatorcontrib>Lourenco, Nelson E.</creatorcontrib><creatorcontrib>Hirose, Kazuyuki</creatorcontrib><title>Time-domain study on reproducibility of laser-based soft-error simulation</title><title>Japanese Journal of Applied Physics</title><addtitle>Jpn. J. Appl. Phys</addtitle><description>Studied is the soft error issue, which is a circuit malfunction caused by ion-radiation-induced noise currents. We have developed a laser-based soft-error simulation system to emulate the noise and evaluate its reproducibility in the time domain. It is found that this system, which utilizes a two-photon absorption process, can reproduce the shape of ion-induced transient currents, which are assumed to be induced from neutrons at the ground level. A technique used to extract the initial carrier structure inside the device is also presented.</description><subject>Absorption</subject><subject>Lasers</subject><subject>Noise</subject><subject>Reproducibility</subject><subject>Simulation</subject><subject>Soft errors</subject><subject>Time domain</subject><subject>Transient current</subject><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNp1kElrwzAQhUVpoely7dnHtiBXsiVZPoZ0Swi0kNyFrAVkbMuV7EP-fRWSY3uZYYbvPWYeAA8Y5RVl1ctms_zOKcsRWb1idgEWuCQVJIjRS7BAqMCQ1EVxDW5ibNPIKMELsN673kDte-mGLE6zPmR-yIIZg9ezco3r3JRWNutkNAE2qeosejtBE4IPWXT93MnJ-eEOXFnZRXN_7rdg9_62X33C7dfHerXcQkUonqBkZU1MLY1qpOUMN401vObcsMpSLpVEVHKNa04IKhSVGitEGFeV5rhqylvweHJNB_7MJk6id1GZrpOD8XMUuEakwKRkNKH5CVXBxxiMFWNwvQwHgZE4JiaOiQnKxCmxJHg6CZwfRevnMKQ_RNvK8QiR3ZkTo7aJff6D_cf4F8XReuc</recordid><startdate>20170401</startdate><enddate>20170401</enddate><creator>Itsuji, Hiroaki</creator><creator>Kobayashi, Daisuke</creator><creator>Lourenco, Nelson E.</creator><creator>Hirose, Kazuyuki</creator><general>The Japan Society of Applied Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20170401</creationdate><title>Time-domain study on reproducibility of laser-based soft-error simulation</title><author>Itsuji, Hiroaki ; Kobayashi, Daisuke ; Lourenco, Nelson E. ; Hirose, Kazuyuki</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c451t-a6394e9aecbaf861bbfe8988e67f58aca05a8d1984402c5ad1c0468c7d817b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Absorption</topic><topic>Lasers</topic><topic>Noise</topic><topic>Reproducibility</topic><topic>Simulation</topic><topic>Soft errors</topic><topic>Time domain</topic><topic>Transient current</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Itsuji, Hiroaki</creatorcontrib><creatorcontrib>Kobayashi, Daisuke</creatorcontrib><creatorcontrib>Lourenco, Nelson E.</creatorcontrib><creatorcontrib>Hirose, Kazuyuki</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Itsuji, Hiroaki</au><au>Kobayashi, Daisuke</au><au>Lourenco, Nelson E.</au><au>Hirose, Kazuyuki</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Time-domain study on reproducibility of laser-based soft-error simulation</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><addtitle>Jpn. J. Appl. Phys</addtitle><date>2017-04-01</date><risdate>2017</risdate><volume>56</volume><issue>4S</issue><spage>4</spage><epage>04CD16</epage><pages>4-04CD16</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPB6</coden><abstract>Studied is the soft error issue, which is a circuit malfunction caused by ion-radiation-induced noise currents. We have developed a laser-based soft-error simulation system to emulate the noise and evaluate its reproducibility in the time domain. It is found that this system, which utilizes a two-photon absorption process, can reproduce the shape of ion-induced transient currents, which are assumed to be induced from neutrons at the ground level. A technique used to extract the initial carrier structure inside the device is also presented.</abstract><pub>The Japan Society of Applied Physics</pub><doi>10.7567/JJAP.56.04CD16</doi></addata></record> |
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| ispartof | Japanese Journal of Applied Physics, 2017-04, Vol.56 (4S), p.4-04CD16 |
| issn | 0021-4922 1347-4065 |
| language | eng |
| recordid | cdi_iop_journals_10_7567_JJAP_56_04CD16 |
| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Absorption Lasers Noise Reproducibility Simulation Soft errors Time domain Transient current |
| title | Time-domain study on reproducibility of laser-based soft-error simulation |
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