Time-domain study on reproducibility of laser-based soft-error simulation

Studied is the soft error issue, which is a circuit malfunction caused by ion-radiation-induced noise currents. We have developed a laser-based soft-error simulation system to emulate the noise and evaluate its reproducibility in the time domain. It is found that this system, which utilizes a two-photon absorption process, can reproduce the shape of ion-induced transient currents, which are assumed to be induced from neutrons at the ground level. A technique used to extract the initial carrier structure inside the device is also presented.