Development of accurate two-dimensional dose-imaging detectors using atomic-scale color centers in Ag-activated phosphate glass and LiF thin films
Novel disk-type X-ray two-dimensional (2D) imaging detectors have been developed by utilising atomic-scale defects as minimum luminescent units such as radiation-induced Ag-related species in Ag-activated phosphate glass and F-aggregated centres in lithium fluoride (LiF) thin films. Such luminescent...
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Veröffentlicht in: | Japanese Journal of Applied Physics 2014-02, Vol.53 (2S), p.2-1-02BD14-5 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Novel disk-type X-ray two-dimensional (2D) imaging detectors have been developed by utilising atomic-scale defects as minimum luminescent units such as radiation-induced Ag-related species in Ag-activated phosphate glass and F-aggregated centres in lithium fluoride (LiF) thin films. Such luminescent detectors are based on the radiophotoluminescence (RPL) and photoluminescence (PL) phenomena, respectively. Accurate accumulated 2D dose distributions with a high spatial resolution of micron order over large areas and a wide dynamic range covering 8 orders of magnitude were rapidly reconstructed and were successfully demonstrated for the first time by combining the Ag-doped glass with LiF thin films. These detectors should be suitable for X- and gamma-ray imaging in radiation diagnostics and clinical radiotherapy. |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.7567/JJAP.53.02BD14 |