Performance of an E-mode AlGaN/GaN High-Electron-Mobility Transistor Integrated with a Current Limiting Diode

In this study, a standard 650 V enhancement-mode (E-mode) AlGaN/GaN HEMT integrated with a current limiting diode (CLD) on a Si substrate is proposed, forming a new configuration (CLD-HEMT) that does not require extra process steps or costs. A CLD is designed from a 650 V AlGaN/GaN HEMT by shorting...

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Veröffentlicht in:ECS journal of solid state science and technology 2023-08, Vol.12 (8), p.85003
Hauptverfasser: Hsin, Yue-Ming, Zhong, Yi-Nan, Lai, Yu-Chen, Tsai, Kai-Hsiang
Format: Artikel
Sprache:eng
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Zusammenfassung:In this study, a standard 650 V enhancement-mode (E-mode) AlGaN/GaN HEMT integrated with a current limiting diode (CLD) on a Si substrate is proposed, forming a new configuration (CLD-HEMT) that does not require extra process steps or costs. A CLD is designed from a 650 V AlGaN/GaN HEMT by shorting the gate and source. The proposed CLD-HEMT demonstrates improved gate capability with an increased input gate voltage swing (>11 V) and enhanced gate reliability in a scenario where a conventional p-GaN gate HEMT would be challenged. Furthermore, the breakdown voltage and reverse conduction are improved in the CLD-HEMT.
ISSN:2162-8769
2162-8777
DOI:10.1149/2162-8777/acec98