A new method of reconstructing current paths in HTS tapes with defects

We propose a new method for calculating current paths in high-temperature superconductive (HTS) tapes with various defects including cracks, non-superconducting inclusions, and superconducting inclusions with lower local critical current density. The calculation method is based on a model of critical state which takes into account the dependence of the critical current on the magnetic field. The method allows us to calculate the spatial distribution of currents flowing through the defective HTS tape for both currents induced by the external magnetic field and transport currents from an external source. For both cases, we performed simulations of the current distributions in these tapes with different types of defects and have shown that the combination of the action of the magnetic field and transport current leads to a more detailed identification of the boundaries and shape of the defects. The proposed method is adapted for calculating modern superconductors in real superconducting devices and may be more useful as compared to the conventional magnetometric diagnostic studies, when the tape is affected by the magnetic field only.