Epitaxial thin film heterostructures of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3-PbTiO3

We have grown stoichiometric pure perovskite phase Pb(Mg 1/3 Nb 2/3 )O 3 -PbTiO 3 (PMN-PT) thin films and PMN-PT/SrRuO 3 heterostructures on miscut (100) SrTiO 3 substrates by pulsed laser deposition. X-ray diffraction θ-2θ scans show that the PMN-PT films are purely c-axis oriented. The off-axis Φ...

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Veröffentlicht in:Integrated ferroelectrics 1998-09, Vol.21 (1-4), p.499-509
Hauptverfasser: Lavric, Dan, Rao, Rajesh A., Gan, Qing, Krajewski, J. J., Eom, Chang-Beom
Format: Artikel
Sprache:eng ; jpn
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Zusammenfassung:We have grown stoichiometric pure perovskite phase Pb(Mg 1/3 Nb 2/3 )O 3 -PbTiO 3 (PMN-PT) thin films and PMN-PT/SrRuO 3 heterostructures on miscut (100) SrTiO 3 substrates by pulsed laser deposition. X-ray diffraction θ-2θ scans show that the PMN-PT films are purely c-axis oriented. The off-axis Φ scans show that the heterostructures grow "cube-on-cube" with an in-plane epitaxial arrangement of PMN-PT[100], [010] // SrRuO 3 [001] // SrTiO 3 [100] and PMN-PT[010], [100] // SrRuO 3 [110] // SrTiO 3 [010]. The crystalline quality of the films found to be comparable to that of bulk single crystals. The AFM images show that the SrRuO 3 and PMN-PT layers have smooth surfaces with root mean square roughness of 9Å. These epitaxial heterostructures can be used for the fabrication of piezoelectric devices.
ISSN:1058-4587
1607-8489
DOI:10.1080/10584589808202090