Performance of commercial ferroelectric memories
The characterization of low density (≤ 64K) ferroelectric memories is presented. Detailed retention characterization of a large number of package memories revels several important effects. The first is that die packaging material effects high temperature retention. The second is that increased signa...
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| Veröffentlicht in: | Integrated ferroelectrics 1995-03, Vol.8 (1-2), p.185-199 |
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| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | The characterization of low density (≤ 64K) ferroelectric memories is presented. Detailed retention characterization of a large number of package memories revels several important effects. The first is that die packaging material effects high temperature retention. The second is that increased signal margin is obtained with a range of fatigue cycles. Finally imprinted retention fails are a strong function of time and temperature. |
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| ISSN: | 1058-4587 1607-8489 |
| DOI: | 10.1080/10584589508012312 |