Difference in microstructure between PZT thin films on Pt/Ti and those on Pt
PZT thin films were synthesized by sol-gel on a Pt/Ti double layer bottom electrode or on a Pt single layer bottom electrode to investigate the bottom electrode dependence of PZT film structure. On Pt/Ti, oriented perovskite grains with 50-100 nm lateral size were densely packed. On Pt, large perovs...
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Veröffentlicht in: | Integrated ferroelectrics 1995-03, Vol.8 (1-2), p.89-98 |
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Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | PZT thin films were synthesized by sol-gel on a Pt/Ti double layer bottom electrode or on a Pt single layer bottom electrode to investigate the bottom electrode dependence of PZT film structure. On Pt/Ti, oriented perovskite grains with 50-100 nm lateral size were densely packed. On Pt, large perovskite grains (2−3 μm) were surrounded by fine pyrochlore grains (about 5 nm), and no certain orientation was observed. TEM and EDX analyses suggested that a fraction of Ti in the Pt/Ti layer diffused along Pt grain boundaries up to the Pt surface and was oxidized during the PZT annealing process. A model for the crystallization of sol-gel derived PZT was proposed, in which TiOx particles at the Pt surface act as nucleation sites for PZT crystallization. This model well explained the experimental results. |
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ISSN: | 1058-4587 1607-8489 |
DOI: | 10.1080/10584589508012303 |