Defect assisted intrinsic luminescence in Al2O3 crystals

The origin of the luminescence bands at 7.5 eV anv 3.8 eV appearing additionaly to the luminescence of F- and F + - centres in pure Al 2 O 3 are investigated. The time - resolved luminescence spectra, absorption and luminescence excitation spectra as well as trap spectroscopy data depending on devia...

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Veröffentlicht in:Radiation effects and defects in solids 1991-01, Vol.119-121 (2), p.963-968
Hauptverfasser: Kulis, P., Rachko, Z., Springis, M., Tale, I., Jansons, J.
Format: Artikel
Sprache:eng
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Zusammenfassung:The origin of the luminescence bands at 7.5 eV anv 3.8 eV appearing additionaly to the luminescence of F- and F + - centres in pure Al 2 O 3 are investigated. The time - resolved luminescence spectra, absorption and luminescence excitation spectra as well as trap spectroscopy data depending on deviation from the stochiometry of crystals are discussed in terms of self - trapping of excitons in two configurations. The role of defects due to annihilation of excitons is considered.
ISSN:1042-0150
1029-4953
DOI:10.1080/10420159108220850