Resistometric study of defects in rhenium following 2.8 MeV electron irradiation at 4.5 K

Resistometric study of defects in rhenium following 2.8 MeV electron irradiation at 4.5 K

The low temperature radiation damage in rhenium caused by 2.8 MeV electron irradiation at 4.5 K has been studied by means of electrical resistivity measurements. The samples were Marz Grade foils supplied by Materials Research Corporation (U.S.A.) with a thickness of 0.03 mm. After a 30 minutes puls...

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Veröffentlicht in:Radiat. Eff., v. 21, no. 2, pp. 137-139 v. 21, no. 2, pp. 137-139, 1974-01, Vol.21 (2), p.137-139
Hauptverfasser: Vandenborre, H., Stals, L., Cornelis, J., Nihoul, J.
Format: Artikel
Sprache:eng
Schlagworte:
ANNEALING
ELECTRIC CONDUCTIVITY
ELECTRON BEAMS
FRENKEL DEFECTS
MEV RANGE 01-10
N50240 -Metals, Ceramics, & Other Materials-Metals & Alloys-Radiation Effects
RECOMBINATION
RHENIUM- PHYSICAL RADIATION EFFECTS
ULTRALOW TEMPERATURE
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Zusammenfassung:The low temperature radiation damage in rhenium caused by 2.8 MeV electron irradiation at 4.5 K has been studied by means of electrical resistivity measurements. The samples were Marz Grade foils supplied by Materials Research Corporation (U.S.A.) with a thickness of 0.03 mm. After a 30 minutes pulse at 2100 K in a vacuum of 2·10 −10 Torr, the electrical resistivity ratio amounted to about 800.
ISSN:0033-7579
DOI:10.1080/10420157408230822