Plasma treatment induced changes of dissolution kinetics of chromium
Exposures of chromium films to argon and freon 114 plasmas were found to modify chromium dissolution kinetics which was measured by following the removal of an implanted radioactive marker during gradual dissolution. The effect is attributed to surface layers (oxide and fluoride) formed by sputterin...
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Veröffentlicht in: | Radiation effects 1984-01, Vol.86 (4), p.121-125 |
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Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | Exposures of chromium films to argon and freon 114 plasmas were found to modify chromium dissolution kinetics which was measured by following the removal of an implanted radioactive marker during gradual dissolution. The effect is attributed to surface layers (oxide and fluoride) formed by sputtering and plasma reactions. A possible application of this effect in manufacturing fine structure chromium masks through wet chemical etching is indicated. |
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ISSN: | 0033-7579 2331-3455 |
DOI: | 10.1080/01422448408209705 |