Memristive behaviour of high-impedance faults

In this reported work, the analogy between parallel electrical arcs and memristors is extended to high-impedance faults such as carbonised paths and circuit openings. First, it is demonstrated that the conductance from the high-impedance Mayr model behaves like a particular memductance sensitive to the integral of the squared current. Then, the current–voltage plot confirms the memristive behaviour of high-impedance faults, both by simulation and with experimental results.