Automatic transistor lead inspection

This paper has described the development of a system for real-time inspection of transistor leads in a production environment. The system has been introduced into a factory in prototype form. This uses a transputer-based image processing system housed in an industrial PC and has given five months op...

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Hauptverfasser:	Hobson, C.A, Wong, K.L, Hamzah, S, Arshad, N.M, Abdullah, S.K.S
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Computer vision and image processing techniques Computerised instrumentation Electronic engineering computing Industrial applications of IT Inspection and quality control Instrumentation Manufacturing processes Optical information, image and video signal processing Pattern recognition and computer vision equipment Production engineering computing Production facilities and engineering Semiconductor devices Semiconductor industry
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Beschreibung
Zusammenfassung:	This paper has described the development of a system for real-time inspection of transistor leads in a production environment. The system has been introduced into a factory in prototype form. This uses a transputer-based image processing system housed in an industrial PC and has given five months operational experience. Cost and other considerations require the production of an embedded system which will form part of the taping machine instrumentation and control system.
DOI:	10.1049/cp:19950693