Extraction of a nonlinear AC FET model using small-signal S-parameters

The nonlinearities of an RF FET can be obtained by a set of small-signal circuit elements extracted over a range of terminal voltages and temperatures. This study used pulsed S-parameter measurements on a 3 /spl times/ 3 DC-bias-point grid at two different temperatures to obtain electrical and elect...

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Veröffentlicht in:	IEEE transactions on microwave theory and techniques 2002-05, Vol.50 (5), p.1311-1315
Hauptverfasser:	Vuolevi, J.H.K., Rahkonen, T.
Format:	Artikel
Sprache:	eng
Schlagworte:	Alternating current Circuits Distortion Distortion measurement Electric variables measurement Electrothermal effects FETs Gain Mathematical models Microwaves Nonlinearity Pulse measurements Radio frequency Scattering parameters Temperature distribution Terminals Voltage
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