Extraction of a nonlinear AC FET model using small-signal S-parameters

The nonlinearities of an RF FET can be obtained by a set of small-signal circuit elements extracted over a range of terminal voltages and temperatures. This study used pulsed S-parameter measurements on a 3 /spl times/ 3 DC-bias-point grid at two different temperatures to obtain electrical and elect...

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Veröffentlicht in:IEEE transactions on microwave theory and techniques 2002-05, Vol.50 (5), p.1311-1315
Hauptverfasser: Vuolevi, J.H.K., Rahkonen, T.
Format: Artikel
Sprache:eng
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Zusammenfassung:The nonlinearities of an RF FET can be obtained by a set of small-signal circuit elements extracted over a range of terminal voltages and temperatures. This study used pulsed S-parameter measurements on a 3 /spl times/ 3 DC-bias-point grid at two different temperatures to obtain electrical and electrothermal nonlinearity coefficients up to the third order. The extracted nonlinear AC model can be used in a Volterra analysis to gain an insight into the distortion mechanisms. The measurement results were in good agreement with the calculated third-order intermodulation values.
ISSN:0018-9480
1557-9670
DOI:10.1109/22.999144