Comprehensive study of substrate noise isolation for mixed-signal circuits

Comprehensive study of substrate noise isolation for mixed-signal circuits

In this paper, we present a study on signal isolation approaches for mixed-signal circuits, via both simple test structures and actual circuits. Analysis was focused on commonly used substrates such as p+, p- and buried p+ substrate. Results show that the selection of substrate, isolation structures...

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Hauptverfasser: To, K.H., Welch, P., Bharatan, S., Lehning, H., Huynh, T.L., Thoma, R., Monk, D., Huang, W.A., Ilderem, V.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
BiCMOS integrated circuits
Circuit noise
Circuit testing
Digital circuits
Isolation technology
Noise generators
Radio frequency
Ring oscillators
Silicon compounds
Switching circuits
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Beschreibung
Zusammenfassung:In this paper, we present a study on signal isolation approaches for mixed-signal circuits, via both simple test structures and actual circuits. Analysis was focused on commonly used substrates such as p+, p- and buried p+ substrate. Results show that the selection of substrate, isolation structures and layout rules have significant impact on the substrate noise isolation.
DOI:10.1109/IEDM.2001.979559