Two-points pulsed thermal diagnostics of thin film materials

Two-points pulsed thermal diagnostics of thin film materials

Thin films and film coatings, wide-used in different branches of modern technique and technology (from electronics up to rocket design), are too inconvenient for thermal nondestructive testing. The conventional front-face-flash methods, which are the most suitable for these purposes, have time limit...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Troitsky, O.Yu, Lyalikov, B.A., Medvedev, V.V., Sok Won Kim
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Aerospace materials
Coatings
Delay
Heating
Nondestructive testing
Pulse measurements
Rockets
Temperature measurement
Time measurement
Transistors
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Beschreibung
Zusammenfassung:Thin films and film coatings, wide-used in different branches of modern technique and technology (from electronics up to rocket design), are too inconvenient for thermal nondestructive testing. The conventional front-face-flash methods, which are the most suitable for these purposes, have time limitation derived from relation between a response time of a measuring system (t/sub d/) and a characteristic time of an investigated object 4/sup ./t/sub d/
DOI:10.1109/KORUS.2001.975240