Characterization of thin film organic materials at high frequency

Characterization of thin film organic materials at high frequency

By considering the potential variation of process parameters such as line width and dielectric thickness, several hybrid coplanar waveguide microstrip (CPWM) well matched lines were designed, fabricated and tested up to 6 GHz on a low loss thin film organic high density interconnect (HDI) substrate....

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Bibliographische Detailangaben
Hauptverfasser: Dalmia, S., Hobbs, J.M., Sundaram, V., Swaminathan, M., White, G.E., Tummala, R.R., Ogitani, S.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Automotive engineering
Costs
Dielectric constant
Dielectric materials
Dielectric measurements
Dielectric substrates
Dielectric thin films
Frequency measurement
Organic materials
Transistors
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Beschreibung
Zusammenfassung:By considering the potential variation of process parameters such as line width and dielectric thickness, several hybrid coplanar waveguide microstrip (CPWM) well matched lines were designed, fabricated and tested up to 6 GHz on a low loss thin film organic high density interconnect (HDI) substrate. The multiple CPWM lines were then used to characterize the thin film dielectric up to 6 GHz.
DOI:10.1109/EPEP.2001.967629