GRAAL: a tool for highly dependable SRAMs generation

Presents a tool to achieve proper reliability levels in systems based on memories, allowing the automatic insertion of BIST architectures for both OFF-line and ON-line memory testing. While OFF-line memory testing was partially targeted by the available commercial tools, ON-line memory testing has s...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Chiusano, S., Di Natale, G., Prinetto, P., Bigongiari, F.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automatic testing Built-in self-test Costs Fault detection Logic testing Memory architecture Process design Random access memory Space technology System testing
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