GRAAL: a tool for highly dependable SRAMs generation

Presents a tool to achieve proper reliability levels in systems based on memories, allowing the automatic insertion of BIST architectures for both OFF-line and ON-line memory testing. While OFF-line memory testing was partially targeted by the available commercial tools, ON-line memory testing has so far not been covered. The set of algorithms and architectures supported by the tool is not limited, and it can be easily extended to include innovative architectures and achieve the reliability requirements in any application. Using the tool, the designer can generate dependable memories, trading-off in the design process dependability properties and costs.