GRAAL: a tool for highly dependable SRAMs generation
Presents a tool to achieve proper reliability levels in systems based on memories, allowing the automatic insertion of BIST architectures for both OFF-line and ON-line memory testing. While OFF-line memory testing was partially targeted by the available commercial tools, ON-line memory testing has s...
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| creator | Chiusano, S. Di Natale, G. Prinetto, P. Bigongiari, F. |
| description | Presents a tool to achieve proper reliability levels in systems based on memories, allowing the automatic insertion of BIST architectures for both OFF-line and ON-line memory testing. While OFF-line memory testing was partially targeted by the available commercial tools, ON-line memory testing has so far not been covered. The set of algorithms and architectures supported by the tool is not limited, and it can be easily extended to include innovative architectures and achieve the reliability requirements in any application. Using the tool, the designer can generate dependable memories, trading-off in the design process dependability properties and costs. |
| doi_str_mv | 10.1109/TEST.2001.966640 |
| format | Conference Proceeding |
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Using the tool, the designer can generate dependable memories, trading-off in the design process dependability properties and costs.</description><subject>Automatic testing</subject><subject>Built-in self-test</subject><subject>Costs</subject><subject>Fault detection</subject><subject>Logic testing</subject><subject>Memory architecture</subject><subject>Process design</subject><subject>Random access memory</subject><subject>Space technology</subject><subject>System testing</subject><issn>1089-3539</issn><issn>2378-2250</issn><isbn>0780371690</isbn><isbn>9780780371699</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2001</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tKw0AUQAcfYFrdi6v5gcR7ZzKP6y6UWoWI0MZ1mSQ3bSQmJcmmf69QV2d1DhwhHhESRKDnYr0rEgWACVlrU7gSkdLOx0oZuBYLcB60Q0twIyIET7E2mu7EYpq-ARQYBZFIN9ssy19kkPMwdLIZRnlsD8fuLGs-cV-HsmO522Yfkzxwz2OY26G_F7dN6CZ--OdSfL2ui9VbnH9u3ldZHrfo1Bx7qGplvAuE2pvSNeRCxURoSOsUXY2gLVSVa3wwFTYulKT-zNQaVhaNXoqnS7dl5v1pbH_CeN5fZvUvlUlDcQ</recordid><startdate>2001</startdate><enddate>2001</enddate><creator>Chiusano, S.</creator><creator>Di Natale, G.</creator><creator>Prinetto, P.</creator><creator>Bigongiari, F.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2001</creationdate><title>GRAAL: a tool for highly dependable SRAMs generation</title><author>Chiusano, S. ; Di Natale, G. ; Prinetto, P. ; Bigongiari, F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i172t-80cd2587a91385b7f97ace9915933417d10360cc7f8a5c1f7ab92172465e26153</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Automatic testing</topic><topic>Built-in self-test</topic><topic>Costs</topic><topic>Fault detection</topic><topic>Logic testing</topic><topic>Memory architecture</topic><topic>Process design</topic><topic>Random access memory</topic><topic>Space technology</topic><topic>System testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Chiusano, S.</creatorcontrib><creatorcontrib>Di Natale, G.</creatorcontrib><creatorcontrib>Prinetto, P.</creatorcontrib><creatorcontrib>Bigongiari, F.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chiusano, S.</au><au>Di Natale, G.</au><au>Prinetto, P.</au><au>Bigongiari, F.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>GRAAL: a tool for highly dependable SRAMs generation</atitle><btitle>Proceedings International Test Conference 2001 (Cat. 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| identifier | ISSN: 1089-3539 |
| ispartof | Proceedings International Test Conference 2001 (Cat. No.01CH37260), 2001, p.250-257 |
| issn | 1089-3539 2378-2250 |
| language | eng |
| recordid | cdi_ieee_primary_966640 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Automatic testing Built-in self-test Costs Fault detection Logic testing Memory architecture Process design Random access memory Space technology System testing |
| title | GRAAL: a tool for highly dependable SRAMs generation |
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