Total dose testing of 10-bit low voltage differential signal (LVDS) serializer and deserializer

Total dose testing of 10-bit low voltage differential signal (LVDS) serializer and deserializer

Commercial deep submicron (< 0.25 micron) CMOS technology exhibits excellent total dose hardness. National Semiconductor LVDS serializer and deserializer circuits, manufactured in this process, were tested to over 115 krd(Si) and 65 krd(Si) respectively, without failure. Testing proved to challen...

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Bibliographische Detailangaben
Hauptverfasser: Hamilton, B.J., Turflinger, T.L.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Cables
Circuit testing
Clocks
CMOS technology
Cranes
Low voltage
Phase locked loops
Semiconductor device manufacture
Software testing
System testing
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Beschreibung
Zusammenfassung:Commercial deep submicron (< 0.25 micron) CMOS technology exhibits excellent total dose hardness. National Semiconductor LVDS serializer and deserializer circuits, manufactured in this process, were tested to over 115 krd(Si) and 65 krd(Si) respectively, without failure. Testing proved to challenge traditional test techniques, as these parts ran at parallel data rates up to 40 MHz.
DOI:10.1109/REDW.2001.960474