Recent radiation damage and single event effect results for candidate spacecraft electronics

Recent radiation damage and single event effect results for candidate spacecraft electronics

We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: O'Bryan, M.V., LaBel, K.A., Reed, R.A., Ladbury, R.L., Howard, J.W., Buchner, S.P., Barth, J.L., Kniffin, S.D., Seidleck, C.M., Marshal, C.J., Marshal, P.W., Kim, H.S., Hawkins, D.K., Carts, M.A., Forney, J.D., Sanders, A.B., Cox, S.R., Dunsmore, C.J., Palor, C.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Aerospace electronics
Cyclotrons
Laboratories
NASA
Protons
Single event upset
Space vehicles
Telephony
Test facilities
Testing
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others.
DOI:10.1109/REDW.2001.960455