Optical and structural studies of compositional inhomogeneity in strain-relaxed indium gallium nitride films

The structural and optical properties of indium gallium nitride (In/sub x/Ga/sub 1-x/N) films with 0.04

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Bibliographische Detailangaben
Hauptverfasser:	Robins, L.H., Armstrong, J.T., Marinenko, R.B., Vaudin, M.D., Bouldin, C.E., Woicik, J.C., Paul, A.J., Thurber, W.R., Miyano, K.E., Parker, C.A., Roberts, J.C., Bedair, S.M., Piner, E.L., Reed, M.J., El-Masry, N.A., Donovan, S.M., Pearton, S.J.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Chemical vapor deposition Electromagnetic wave absorption Gallium nitride III-V semiconductor materials Indium Optical diffraction Optical films Spectroscopy X-ray diffraction X-ray scattering
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Beschreibung
Zusammenfassung:	The structural and optical properties of indium gallium nitride (In/sub x/Ga/sub 1-x/N) films with 0.04
DOI:	10.1109/ISCS.2000.947207