ReRAM-Based Pseudo-True Random Number Generator With High Throughput and Unpredictability Characteristics

We report an ReRAM-based pseudo-true random number generator (RNG) which can significantly improve the security feature of e-ReRAM chips at a very low cost. Combining the true randomness from stochastic behavior of ReRAM and the high output speed from a modified linear feedback shift register (LFSR)...

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Veröffentlicht in:IEEE transactions on electron devices 2021-04, Vol.68 (4), p.1593-1597
Hauptverfasser: Tseng, Po-Hao, Lee, Ming-Hsiu, Lin, Yu-Hsuan, Lung, Hsiang-Lan, Wang, Keh-Chung, Lu, Chih-Yuan
Format: Artikel
Sprache:eng
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Zusammenfassung:We report an ReRAM-based pseudo-true random number generator (RNG) which can significantly improve the security feature of e-ReRAM chips at a very low cost. Combining the true randomness from stochastic behavior of ReRAM and the high output speed from a modified linear feedback shift register (LFSR), the proposed architecture can provide ultrahigh throughput random sequence following system clocks from several Mbit/sec to tens of Gbit/sec. The highly reliable, unpredictable, and unrepeatable ReRAM-based pseudo-true RNG circuit can pass NIST SP800-22 randomness tests at a high score. It is suitable for secure IoT and 5G applications.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2021.3057028