Erratum to "A Test Response Compression Method for Monolithic 3-D ICs Based on 3-D Haar Wavelet Transforms" [2021 Art. no. 3506412]

Erratum to "A Test Response Compression Method for Monolithic 3-D ICs Based on 3-D Haar Wavelet Transforms" [2021 Art. no. 3506412]

In the above article [1] , the following sentence on page 5, right column, has been corrected to read as follows: for two detected faults in the Fig. 11(a) and (c) case, even if there is a big difference between their measurement values, they will have the same saved data.

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Veröffentlicht in:IEEE transactions on instrumentation and measurement 2021-01, Vol.70, p.1-1
Hauptverfasser: Hu, Jing, Lin, Yuheng, Hu, Ming, Wang, Hongjian
Format: Artikel
Sprache:eng
Schlagworte:
Fault detection
Integrated circuits
Three-dimensional integrated circuits
Wavelet transforms
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Zusammenfassung:In the above article [1] , the following sentence on page 5, right column, has been corrected to read as follows: for two detected faults in the Fig. 11(a) and (c) case, even if there is a big difference between their measurement values, they will have the same saved data.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2021.3051991