Guaranteeing quality throughout the product life cycle: on-line test and repair to the rescue

Summary form only given, as follows. The panel will address the following issues: (1) Many of the defect behaviors in very-deep-sub-micron technologies are complex functions of voltage, temperature and input signals. Many of these defects may be just flaws that can cause earlylife failures. Detectin...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Bottoms, B., Chung, J., Koenemann, B., Shirley, G., Spainhower, L.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Costs Fault tolerance Integrated circuit noise Life testing Logic testing Low voltage Production Semiconductor device testing System testing Temperature
Online-Zugang:	Volltext bestellen
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