Scan wheel-a technique for interfacing a high speed scan-path with a slow speed tester

Scan wheel-a technique for interfacing a high speed scan-path with a slow speed tester

A novel interface architecture allows slow-speed test equipment to control and access scan registers operating at the full clock rate of the chip or the system. The architecture requires simple on-chip hardware and works with a minimal number of chip pins.

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Bibliographische Detailangaben
1. Verfasser: Bhavsar, D.K.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Circuit testing
Clocks
Computer architecture
Control systems
Delay
Pins
Registers
System testing
Test equipment
Wheels
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Beschreibung
Zusammenfassung:A novel interface architecture allows slow-speed test equipment to control and access scan registers operating at the full clock rate of the chip or the system. The architecture requires simple on-chip hardware and works with a minimal number of chip pins.
DOI:10.1109/VTS.2001.923424