Discussion of "Impact of subcycle transfer switches on distribution system reliability" [and reply]

Discussion of "Impact of subcycle transfer switches on distribution system reliability" [and reply]

J.E. Jipping et al. comment on the paper by R.E. Brown et al. (see ibid., vol.15, no.1, p.442-7, 2000). They point out that the effect of voltage sags should be considered in reliability models. The original authors reply to the comments.

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on power systems 2000-11, Vol.15 (4), p.1454-1455
Hauptverfasser: Jipping, J.E., Carter, W.E., Brown, R.E., Ochoa, J.R.
Format: Artikel
Sprache:eng
Schlagworte:
Circuit breakers
Circuit faults
Circuit testing
Power quality
Power system modeling
Power system reliability
Sociotechnical systems
Switches
System testing
Voltage fluctuations
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Zusammenfassung:J.E. Jipping et al. comment on the paper by R.E. Brown et al. (see ibid., vol.15, no.1, p.442-7, 2000). They point out that the effect of voltage sags should be considered in reliability models. The original authors reply to the comments.
ISSN:0885-8950
1558-0679
DOI:10.1109/59.919218