Correlated light beam induced current and infrared thermography mapping applied to the local characterization of large area multicrystalline solar cells

The aim of this paper is to use light-beam-induced current (LBIC) mapping and infrared thermography (IRT) associated with signal treatment processing to characterize large area solar cells. Samples used in this study are industrial 10 cm /spl times/10 cm multicrystalline silicon solar cells. In the LBIC experimental setup a laser diode (780 nm) is used in a modulated mode. The spot diameter and the depth of field of the incident beam are 20 /spl mu/m and 80 /spl mu/m respectively. For thermal mapping, the infrared camera is an Agema 880 SW with an InSb detector. Comparison and correlation between the two nondestructive techniques are presented for analysis of local shunts and defects.