360 GHz fMAX Graded-Channel AlGaN/GaN HEMTs for mmW Low-Noise Applications

We report scaled, graded-channel AlGaN/GaN HEMTs with an extrinsic f T and f MAX of 170 GHz and 363 GHz, which is the highest in emerging graded-channel GaN HEMTs. At 50-nm gate length, the f T *Lg of 8.5 GHz \ast \mu \text{m} is comparable to that of conventional scaled AlGaN/GaN HEMTs fabricated...

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Veröffentlicht in:IEEE electron device letters 2020-08, Vol.41 (8), p.1173-1176
Hauptverfasser: Moon, Jeong-Sun, Wong, Joel, Grabar, Bob, Antcliffe, Mike, Chen, Peter, Arkun, Erdem, Khalaf, Isaac, Corrion, Andrea, Chappell, James, Venkatesan, Nivedhita, Fay, Patrick
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Sprache:eng
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Zusammenfassung:We report scaled, graded-channel AlGaN/GaN HEMTs with an extrinsic f T and f MAX of 170 GHz and 363 GHz, which is the highest in emerging graded-channel GaN HEMTs. At 50-nm gate length, the f T *Lg of 8.5 GHz \ast \mu \text{m} is comparable to that of conventional scaled AlGaN/GaN HEMTs fabricated together. At low DC power, the scaled graded-channel AlGaN/GaN HEMTs show a higher f MAX than the scaled AlGaN/GaN HEMT with the same gate length. The devices also exhibit a 2 dB improvement in gain at low DC bias, and the measured minimum noise figure was as low as 0.5 dB at 30 GHz. This is comparable to state-of-the-art device noise figure from a 20-nm gate length AlGaN/GaN HEMT. The combination of improved f T , f MAX , and minimum noise figure at low DC power for the graded-channel AlGaN/GaN HEMTs shows great promise for ultra-low-power, low-noise amplifiers.
ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2020.3005337