THz spectroscopy with ultrahigh sensitivity
Summary form only given.Although THz radiation has been used successfully for several applications the signal-to-noise ratio is mostly restricted to 10/sup 4/ to 10/sup 6/ in intensity. Especially for thin films of material the absorption and time delay of a THz pulse are mostly too low to be detect...
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creator | Brucherseifer, M. Pellemans, H.P.M. Haring Bolivar, P. Kurz, H. |
description | Summary form only given.Although THz radiation has been used successfully for several applications the signal-to-noise ratio is mostly restricted to 10/sup 4/ to 10/sup 6/ in intensity. Especially for thin films of material the absorption and time delay of a THz pulse are mostly too low to be detected. We show a new method to enhance the sensitivity of THz spectroscopy to relative changes of 10/sup -10/ in intensity by shaking a sample through the focus of a THz beam and using lock-in detection on the shaking frequency. |
doi_str_mv | 10.1109/CLEO.2000.907380 |
format | Conference Proceeding |
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Especially for thin films of material the absorption and time delay of a THz pulse are mostly too low to be detected. We show a new method to enhance the sensitivity of THz spectroscopy to relative changes of 10/sup -10/ in intensity by shaking a sample through the focus of a THz beam and using lock-in detection on the shaking frequency.</description><identifier>ISBN: 1557526346</identifier><identifier>ISBN: 9781557526342</identifier><identifier>DOI: 10.1109/CLEO.2000.907380</identifier><language>eng</language><publisher>IEEE</publisher><subject>Delay effects ; Laser beams ; Magnetic fields ; Resists ; Sampling methods ; Spectroscopy</subject><ispartof>Conference on Lasers and Electro-Optics (CLEO 2000). Technical Digest. Postconference Edition. TOPS Vol.39 (IEEE Cat. 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We show a new method to enhance the sensitivity of THz spectroscopy to relative changes of 10/sup -10/ in intensity by shaking a sample through the focus of a THz beam and using lock-in detection on the shaking frequency.</description><subject>Delay effects</subject><subject>Laser beams</subject><subject>Magnetic fields</subject><subject>Resists</subject><subject>Sampling methods</subject><subject>Spectroscopy</subject><isbn>1557526346</isbn><isbn>9781557526342</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2000</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj0FLwzAYQAMiqHP34al3af2Sb1-zHKVMJxR26X1kyZc1Ml1polJ_vcJ2eocHD54QCwmVlGCemna9rRQAVAY0ruBK3EkiTarGZX0j5im9_0sg0CDpVjx2m98iDezyeEruNEzFT8x98XXMo-3joS8Sf6aY43fM0724DvaYeH7hTHQv667ZlO329a15bsu40rkMxiMFIiSlFXPwe_Ag2bs9ccClccpp4yFQqKlW0mogZbxzWkm0aB3OxMM5G5l5N4zxw47T7nyDfxeSQGs</recordid><startdate>2000</startdate><enddate>2000</enddate><creator>Brucherseifer, M.</creator><creator>Pellemans, H.P.M.</creator><creator>Haring Bolivar, P.</creator><creator>Kurz, H.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2000</creationdate><title>THz spectroscopy with ultrahigh sensitivity</title><author>Brucherseifer, M. ; Pellemans, H.P.M. ; Haring Bolivar, P. ; Kurz, H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i87t-f9d35f5535272eefdb0d01edcb5ef349c2c79d0f5f65621a70529dcc7213a3ac3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Delay effects</topic><topic>Laser beams</topic><topic>Magnetic fields</topic><topic>Resists</topic><topic>Sampling methods</topic><topic>Spectroscopy</topic><toplevel>online_resources</toplevel><creatorcontrib>Brucherseifer, M.</creatorcontrib><creatorcontrib>Pellemans, H.P.M.</creatorcontrib><creatorcontrib>Haring Bolivar, P.</creatorcontrib><creatorcontrib>Kurz, H.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Brucherseifer, M.</au><au>Pellemans, H.P.M.</au><au>Haring Bolivar, P.</au><au>Kurz, H.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>THz spectroscopy with ultrahigh sensitivity</atitle><btitle>Conference on Lasers and Electro-Optics (CLEO 2000). 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ispartof | Conference on Lasers and Electro-Optics (CLEO 2000). Technical Digest. Postconference Edition. TOPS Vol.39 (IEEE Cat. No.00CH37088), 2000, p.553-554 |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Delay effects Laser beams Magnetic fields Resists Sampling methods Spectroscopy |
title | THz spectroscopy with ultrahigh sensitivity |
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