A built-in self-repair analyzer (CRESTA) for embedded DRAMs

A new practical built-in self-repair analyzer algorithm for embedded DRAMs (e-DRAM) achieves 100% detection ability of the repairable chips with 1% area penalty of the target 32 Mb embedded DRAM by 4 parallel analyzers. It works at as fast as 500 MHz, well beyond targeted e-DRAMs' maximum opera...

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Bibliographische Detailangaben
Hauptverfasser:	Kawagoe, T., Ohtani, J., Niiro, M., Ooishi, T., Hamada, M., Hidaka, H.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Algorithm design and analysis Automatic testing Built-in self-test Costs Failure analysis Large scale integration Manufacturing Production management Random access memory Ultra large scale integration
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Beschreibung
Zusammenfassung:	A new practical built-in self-repair analyzer algorithm for embedded DRAMs (e-DRAM) achieves 100% detection ability of the repairable chips with 1% area penalty of the target 32 Mb embedded DRAM by 4 parallel analyzers. It works at as fast as 500 MHz, well beyond targeted e-DRAMs' maximum operation speed around 200 MHz+.
ISSN:	1089-3539 2378-2250
DOI:	10.1109/TEST.2000.894250