A realistic fault model for flash memories

A realistic fault model for flash memories

To explore all faulty behavior on NAND-type flash memory is impractical, and the defects in the SPICE model level are considered. In this paper, two SPICE models of the flash cell are developed and used for circuit-level faulty behavior simulation. The faulty behaviors can be classified to six types...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Horng, Yea-Ling, Huang, Jing-Reng, Chang, Tsin-Yuan
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Capacitance
Circuit faults
Circuit simulation
Flash memory
Medical simulation
Nonvolatile memory
Random access memory
SPICE
Switches
Wires
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Beschreibung
Zusammenfassung:To explore all faulty behavior on NAND-type flash memory is impractical, and the defects in the SPICE model level are considered. In this paper, two SPICE models of the flash cell are developed and used for circuit-level faulty behavior simulation. The faulty behaviors can be classified to six types and applied for the fault modeling or testing of NAND-type flash memory.
ISSN:1081-7735
2377-5386
DOI:10.1109/ATS.2000.893637