Refractive-index profiling of graded-index planar waveguides from effective indexes measured with different external refractive indexes

Refractive-index profiling of graded-index planar waveguides from effective indexes measured with different external refractive indexes

We extend the well-known inverse Wentzel-Kramer-Brillouin (WKB) method for refractive-index profiling of graded-index planar waveguides. We demonstrate, with numerical examples and experimental results, that the refractive-index profile of a graded-index planar waveguide can be calculated from effec...

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Veröffentlicht in:Journal of lightwave technology 2000-10, Vol.18 (10), p.1412-1417
Hauptverfasser: Chiang, Kin Seng, Wong, Chi Lai, Cheng, Sin Yip, Chan, Hau Ping
Format: Artikel
Sprache:eng
Schlagworte:
Accuracy
Applied sciences
Circuit properties
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Integrated optics. Optical fibers and wave guides
Inverse
Mathematical analysis
Mathematical models
Optical and optoelectronic circuits
Optical device fabrication
Optical planar waveguides
Optical refraction
Optical variables control
Optical waveguides
Planar waveguides
Profiling
Refractive index
Refractivity
Silicon compounds
Tellurium
Wavelength measurement
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Beschreibung
Zusammenfassung:We extend the well-known inverse Wentzel-Kramer-Brillouin (WKB) method for refractive-index profiling of graded-index planar waveguides. We demonstrate, with numerical examples and experimental results, that the refractive-index profile of a graded-index planar waveguide can be calculated from effective indexes measured with different external refractive indexes. With this technique, single-mode and two-mode waveguides can be profiled easily to a good accuracy.
ISSN:0733-8724
1558-2213
DOI:10.1109/50.887193