A Synergistic Concealed Information Test With Novel Approach for EEG Channel Selection and SVM Parameter Optimization

In the era of data, it is a challenging task to classify continuous data such as electroencephalographic data. The electroencephalographic signal maps several thoughts going in an individual's brain by connecting a device to the human brain. In this paper, we have proposed a deceit identification system using a test called "concealed information test." The electroencephalographic data have been recorded when the concealed information test is performed for experimental analysis. To enhance the performance of the deceit identification system, the optimization of support vector machine (SVM) parameters and the selection of the EEG channels are performed. This paper implements a binary version of the BAT algorithm (binary BAT algorithm) and the conventional BAT algorithm on the electroencephalography (EEG) data. A novel cost function is also proposed, which utilizes the results of continuous BAT and binary BAT to enhance the system performance. In this synergistic approach, BAT is used for the SVM parameters optimization, and the binary BAT algorithm is applied for the EEG channel selection. The performance of the system is improved, and it is inferred that the channels placed at the occipital lobe of the brain consist of the artifacts. After removing the channels placed on the occipital lobe, i.e., O1, Oz, and O2, and using the optimized SVM parameters, the system's average accuracy increases from 94.11% to 96.8%.