Tutorial: synchronous dynamic memory test construction-a field approach

Tutorial: synchronous dynamic memory test construction-a field approach

This paper gives an introduction how to construct dynamic memory tests and test flows. Step by step a basic march test is developed choosing a pattern, voltage levels and timings. Starting with this basic pattern, modifications for characterization, diagnostic and speed testing are discussed. These...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Vollrath, J.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Analog circuits
Capacitors
Circuit testing
Logic circuits
Logic testing
SDRAM
Semiconductor device testing
Timing
Tutorial
Voltage
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Beschreibung
Zusammenfassung:This paper gives an introduction how to construct dynamic memory tests and test flows. Step by step a basic march test is developed choosing a pattern, voltage levels and timings. Starting with this basic pattern, modifications for characterization, diagnostic and speed testing are discussed. These variations are then used to construct a test sequence to ensure functionality according to the data sheet specification.
ISSN:1087-4852
2576-9154
DOI:10.1109/MTDT.2000.868616