Integrating parallel processes in CMOS photodetector chip

Integrating parallel processes in CMOS photodetector chip

In this work we show that the parallel functions of edge detection and classification for an image detector can be integrated in a CMOS silicon chip as an extension of early research reported by different authors that employ neural models. The resulting system is possible due to analog current-mode...

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Bibliographische Detailangaben
Hauptverfasser: Garcia-Lamont, J., Flores-Nava, L.M., Gomez-Castaneda, F., Moreno-Cadenas, J.A.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Circuit testing
CMOS process
Computer architecture
Joining processes
Mirrors
Parallel algorithms
Photodetectors
Phototransistors
Voltage
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Beschreibung
Zusammenfassung:In this work we show that the parallel functions of edge detection and classification for an image detector can be integrated in a CMOS silicon chip as an extension of early research reported by different authors that employ neural models. The resulting system is possible due to analog current-mode techniques that reduce architecture complexity.
DOI:10.1109/ICONIP.1999.845658