A convenient calibration procedure of four-port reflectometers: application on six-port reflectometer and heterodyne network analyzer

A convenient calibration procedure of four-port reflectometers: application on six-port reflectometer and heterodyne network analyzer

This paper presents a millimeter-wave six-port reflectometer in the W-frequency band (75-110 GHz). A convenient calibration technique requiring two standards is described. The measurement performance of this method is compared with the results of a dual six-port network analyzer using the LRL calibr...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Abou Chahine, S., Huyart, B., Jallet, L.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Calibration
Circuits
Detectors
Equations
Measurement standards
Millimeter wave measurements
Millimeter wave technology
Performance analysis
Reflection
Schottky diodes
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:This paper presents a millimeter-wave six-port reflectometer in the W-frequency band (75-110 GHz). A convenient calibration technique requiring two standards is described. The measurement performance of this method is compared with the results of a dual six-port network analyzer using the LRL calibration procedure. Moreover, characterization of some components by the heterodyne network analyzer in the reflection mode using this technique and other calibration methods are presented.
DOI:10.1109/NRSC.2000.838844