SINR and Throughput of Dense Cellular Networks With Stretched Exponential Path Loss
Distance-based attenuation is a critical aspect of wireless communications. As opposed to the ubiquitous powerlaw path loss model, this paper proposes a stretched exponential path loss model that is suitable for short-range communication. In this model, the signal power attenuates over a distance r...
Gespeichert in:
Veröffentlicht in: | IEEE transactions on wireless communications 2018-02, Vol.17 (2), p.1147-1160 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Distance-based attenuation is a critical aspect of wireless communications. As opposed to the ubiquitous powerlaw path loss model, this paper proposes a stretched exponential path loss model that is suitable for short-range communication. In this model, the signal power attenuates over a distance r as e -αr β , where α and β are tunable parameters. Using experimental propagation measurements, we show that the proposed model is accurate for short to moderate distances in the range r ∈ (5, 300) meters and so is a suitable model for dense and ultradense networks. We integrate this path loss model into a downlink cellular network with base stations modeled by a Poisson point process, and derive expressions for the coverage probability, potential throughput, and area spectral efficiency. Although the most general result for coverage probability has a double integral, several special cases are given, where the coverage probability has a compact or even closed form. We then show that the potential throughput is maximized for a particular BS density and then collapses to zero for high densities, assuming a fixed signal-to-interference-plus-noise ratio (SINR) threshold. We next prove that the area spectral efficiency, which assumes an adaptive SINR threshold, is nondecreasing with the BS density and converges to a constant for high densities. |
---|---|
ISSN: | 1536-1276 1558-2248 |
DOI: | 10.1109/TWC.2017.2776905 |