Practical application of automated fault diagnosis for stuck-at, bridging, and measurement condition dependent faults in fully scanned sequential circuits

A practical fault diagnosis system based on combination automatic test pattern generation (ATPG) and fault simulation is described. Our fault diagnosis system deals with conventional stuck-at and bridging faults, as well as measurement condition dependent (MCD) faults in order to diagnose those faults causing different behavior with measurement condition such as supply voltage and temperature, using single stuck-at based diagnosis techniques. Experimental results with a practical very deep submicron (VDSM) LSI circuit shows that a defective chip can be efficiently diagnosed using our diagnostic algorithm and newly proposed MCD fault model.