Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment

SEMATECH has sponsored a "Test Method Evaluation" study to understand the trade-offs among the most common test methodologies used in the industry. This paper presents the results of the failure analysis portion of that project. The testing, reliability stressing, characterization, fault d...

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Bibliographische Detailangaben
Hauptverfasser: Nigh, P., Vallett, D., Patel, A., Wright, J., Motika, F., Forlenza, D., Kurtulik, R., Chong, W.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Analytical models
Failure analysis
Fault detection
Information analysis
Logic testing
Manufacturing industries
Microelectronics
Optimization methods
Timing
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Beschreibung
Zusammenfassung:SEMATECH has sponsored a "Test Method Evaluation" study to understand the trade-offs among the most common test methodologies used in the industry. This paper presents the results of the failure analysis portion of that project. The testing, reliability stressing, characterization, fault diagnosis and physical analysis results are presented for 25 devices including "IDDq-only" failures and "delay test-only" failures.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.1999.805883