On the fault-injection-caused increase of the DAE-index in analogue fault simulation

This paper demonstrates the possibility of the occurrence of numerical problems in analogue fault simulation due to a fault-injection-caused increase of the DAE-index. Based on analytical results and fault simulation experiments with two electrical networks it is shown that a network showing no nume...

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Bibliographische Detailangaben

Hauptverfasser:	Straube, B., Reinschke, K., Vermeiren, W., Robenack, K., Muller, B., Clauss, C.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Capacitors Circuit faults Circuit simulation Differential equations Fault detection Inductors Intelligent networks Resistors Testing Voltage
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