On the fault-injection-caused increase of the DAE-index in analogue fault simulation

On the fault-injection-caused increase of the DAE-index in analogue fault simulation

This paper demonstrates the possibility of the occurrence of numerical problems in analogue fault simulation due to a fault-injection-caused increase of the DAE-index. Based on analytical results and fault simulation experiments with two electrical networks it is shown that a network showing no nume...

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Hauptverfasser: Straube, B., Reinschke, K., Vermeiren, W., Robenack, K., Muller, B., Clauss, C.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Capacitors
Circuit faults
Circuit simulation
Differential equations
Fault detection
Inductors
Intelligent networks
Resistors
Testing
Voltage
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Beschreibung
Zusammenfassung:This paper demonstrates the possibility of the occurrence of numerical problems in analogue fault simulation due to a fault-injection-caused increase of the DAE-index. Based on analytical results and fault simulation experiments with two electrical networks it is shown that a network showing no numerical problems during its fault-free simulations may increase its index as a result of the injection of a fault. The higher index causes numerical problems during the simulation. Some suggestions to tackle such index problems are discussed.
DOI:10.1109/ETW.1999.804423