Highly testable finite state machines based on EXOR logic

It is well-known that AND/EXOR circuits are more easily testable than AND/OR circuits. Therefore, in this paper, we primarily propose to use AND/EXOR realizations for implementation of the combinational logic parts of finite state machines. Then, we investigate the effect of different state assignme...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Kalay, U., Venkataramaiah, N., Mishchenko, A., Hall, D.V., Perkowski, M.A.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Area measurement Automata Automatic testing Circuit faults Circuit testing Combinational circuits Input variables Integrated circuit measurements Logic circuits Logic testing
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