Occurrence and elimination of anomalous temperature dependence of latchup trigger currents in BiCMOS processes

Occurrence and elimination of anomalous temperature dependence of latchup trigger currents in BiCMOS processes

Latchup trigger currents in a BiCMOS process show an extreme temperature dependence (from >100 mA to

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Bibliographische Detailangaben
Hauptverfasser: Ooms, E.R., Van der Pol, J.A.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
BiCMOS integrated circuits
Bipolar transistor circuits
Bipolar transistors
CMOS process
Qualifications
Stress
Substrates
Temperature dependence
Testing
Voltage
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Beschreibung
Zusammenfassung:Latchup trigger currents in a BiCMOS process show an extreme temperature dependence (from >100 mA to
DOI:10.1109/RELPHY.1999.761605