Parametric built-in self-test of VLSI systems

Conventionally, Automatic Test Equipment (ATE) has been used for parametric tests of VLSI systems to determine the influence of clock speed, supply voltage, and temperature on the specified functionality of the circuit under test. This method is likely to become infeasible in the near future due to...

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Bibliographische Detailangaben

Hauptverfasser:	Niggemeyer, D., Ruffer, M.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Accuracy Automatic test equipment Automatic testing Built-in self-test Circuit testing CMOS technology Phase locked loops System testing Timing Very large scale integration
Online-Zugang:	Volltext bestellen
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