Calibration of the PTP vector network analyzer
A calibration procedure for perturbation two-port vector network analyzer (PTP VNA) is presented. PTP VNA consists of a variable perturbation two-port (PTP) placed between a device under test (DUT) and a scalar network analyzer (SNA). A vector reflection coefficient of the DUT is determined on the b...
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creator | Hoffmann, K. Skvor, Z. |
description | A calibration procedure for perturbation two-port vector network analyzer (PTP VNA) is presented. PTP VNA consists of a variable perturbation two-port (PTP) placed between a device under test (DUT) and a scalar network analyzer (SNA). A vector reflection coefficient of the DUT is determined on the basis of amplitude only measurements. A full correction of SNA systematic errors is possible. In principle it may be used up to millimetre and submillimetre frequency bands. |
doi_str_mv | 10.1109/MIKON.1998.742810 |
format | Conference Proceeding |
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PTP VNA consists of a variable perturbation two-port (PTP) placed between a device under test (DUT) and a scalar network analyzer (SNA). A vector reflection coefficient of the DUT is determined on the basis of amplitude only measurements. A full correction of SNA systematic errors is possible. In principle it may be used up to millimetre and submillimetre frequency bands.</description><identifier>ISBN: 8390666200</identifier><identifier>ISBN: 9788390666204</identifier><identifier>DOI: 10.1109/MIKON.1998.742810</identifier><language>eng</language><publisher>IEEE</publisher><subject>Calibration ; Electromagnetic measurements ; Equations ; Error correction ; Frequency conversion ; Frequency measurement ; Reflection ; Scattering parameters ; Testing ; Wideband</subject><ispartof>12th International Conference on Microwaves and Radar. MIKON-98. Conference Proceedings (IEEE Cat. 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PTP VNA consists of a variable perturbation two-port (PTP) placed between a device under test (DUT) and a scalar network analyzer (SNA). A vector reflection coefficient of the DUT is determined on the basis of amplitude only measurements. A full correction of SNA systematic errors is possible. In principle it may be used up to millimetre and submillimetre frequency bands.</description><subject>Calibration</subject><subject>Electromagnetic measurements</subject><subject>Equations</subject><subject>Error correction</subject><subject>Frequency conversion</subject><subject>Frequency measurement</subject><subject>Reflection</subject><subject>Scattering parameters</subject><subject>Testing</subject><subject>Wideband</subject><isbn>8390666200</isbn><isbn>9788390666204</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1998</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tOwzAUBS0hJKD0A2DlH0i4juPXEkVQKgrtoqwrP66FISTIsajK11OpnM3sRnMIuWFQMwbm7mX5vH6tmTG6Vm2jGZyRK80NSCkbgAsyn6YPOI4bIbi-JHVn--SyLWkc6BhpeUe62W7oD_oyZjpg2Y_5k9rB9odfzNfkPNp-wvk_Z-Tt8WHbPVWr9WLZ3a-qxFRbKu1kE5UH4VvFlVb-WACsDQGtUAy1cV4bHoOXUnPurJNRo_SAFkMjguQzcnvyJkTcfef0ZfNhd3rE_wDpnkEf</recordid><startdate>1998</startdate><enddate>1998</enddate><creator>Hoffmann, K.</creator><creator>Skvor, Z.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1998</creationdate><title>Calibration of the PTP vector network analyzer</title><author>Hoffmann, K. ; Skvor, Z.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i174t-8b62f7c05c473787c390014ddea571e89bc893fdc66833bab6f8e6c0eaed25d63</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Calibration</topic><topic>Electromagnetic measurements</topic><topic>Equations</topic><topic>Error correction</topic><topic>Frequency conversion</topic><topic>Frequency measurement</topic><topic>Reflection</topic><topic>Scattering parameters</topic><topic>Testing</topic><topic>Wideband</topic><toplevel>online_resources</toplevel><creatorcontrib>Hoffmann, K.</creatorcontrib><creatorcontrib>Skvor, Z.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hoffmann, K.</au><au>Skvor, Z.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Calibration of the PTP vector network analyzer</atitle><btitle>12th International Conference on Microwaves and Radar. MIKON-98. Conference Proceedings (IEEE Cat. No.98EX195)</btitle><stitle>MIKON</stitle><date>1998</date><risdate>1998</risdate><volume>3</volume><spage>710</spage><epage>714 vol.3</epage><pages>710-714 vol.3</pages><isbn>8390666200</isbn><isbn>9788390666204</isbn><abstract>A calibration procedure for perturbation two-port vector network analyzer (PTP VNA) is presented. PTP VNA consists of a variable perturbation two-port (PTP) placed between a device under test (DUT) and a scalar network analyzer (SNA). A vector reflection coefficient of the DUT is determined on the basis of amplitude only measurements. A full correction of SNA systematic errors is possible. In principle it may be used up to millimetre and submillimetre frequency bands.</abstract><pub>IEEE</pub><doi>10.1109/MIKON.1998.742810</doi></addata></record> |
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identifier | ISBN: 8390666200 |
ispartof | 12th International Conference on Microwaves and Radar. MIKON-98. Conference Proceedings (IEEE Cat. No.98EX195), 1998, Vol.3, p.710-714 vol.3 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Calibration Electromagnetic measurements Equations Error correction Frequency conversion Frequency measurement Reflection Scattering parameters Testing Wideband |
title | Calibration of the PTP vector network analyzer |
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