Advanced semiconductor laser based electro-optical sampling system using soliton pulse compression for direct probing at 1.55-/spl mu/m wavelength

Advanced semiconductor laser based electro-optical sampling system using soliton pulse compression for direct probing at 1.55-/spl mu/m wavelength

We report on a compact, reliable and easy to use electro-optic sampling (EOS) system with high temporal resolution, and increased voltage sensitivity. With an operating wavelength of 1.55 /spl mu/m and subpicosecond time jitter of the optical source, it is particularly suited for characterizing ultr...

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Bibliographische Detailangaben
Hauptverfasser: Reimann, O., Huhse, D., Droge, E., Botcher, E.H., Bimberg, D., Stahlmann, H.D.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Earth Observing System
Jitter
Lasers and electrooptics
Optical devices
Optical receivers
Optical sensors
Sampling methods
Semiconductor lasers
Ultrafast optics
Voltage
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Beschreibung
Zusammenfassung:We report on a compact, reliable and easy to use electro-optic sampling (EOS) system with high temporal resolution, and increased voltage sensitivity. With an operating wavelength of 1.55 /spl mu/m and subpicosecond time jitter of the optical source, it is particularly suited for characterizing ultrafast long-wavelength photodetectors and receivers as well as electrically synchronized ultrahigh-speed devices and ICs.
DOI:10.1109/LEOS.1998.737806