A simple approach to SEU cross section evaluation [semiconductor memories]

A simple approach to SEU cross section evaluation [semiconductor memories]

The simplified method for determination of proton induced SEU cross section is presented. The method is based on results of the analysis of experimental SEU cross sections initiated by fast nucleons. The possibility of SEU cross section measurement at single proton energy for SEU rate prediction is...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE Transactions on Nuclear Science 1998-12, Vol.45 (6), p.2884-2890
Hauptverfasser: Miroshkin, V.V., Tverskoy, M.G.
Format: Artikel
Sprache:eng
Schlagworte:
CALCULATION METHODS
Data analysis
Energy measurement
ERRORS
INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS
Neutrons
Nuclear measurements
Nuclear physics
Parameter estimation
PHYSICAL RADIATION EFFECTS
Predictive models
Projectiles
PROTONS
Semiconductor memory
SEMICONDUCTOR STORAGE DEVICES
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The simplified method for determination of proton induced SEU cross section is presented. The method is based on results of the analysis of experimental SEU cross sections initiated by fast nucleons. The possibility of SEU cross section measurement at single proton energy for SEU rate prediction is shown.
ISSN:0018-9499
1558-1578
DOI:10.1109/23.736543